Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Modeling Current Transfer from PV Modules Based on Meteorological Data

Conference ·
Current transferred from the active cell circuit to ground in modules undergoing potential-induced degradation (PID) stress is analyzed with respect to meteorological data. Duration and coulombs transferred as a function of whether the module is wet (from dew or rain) or the extent of uncondensed surface humidity are quantified based on meteorological indicators. With this, functions predicting the mode and rate of coulomb transfer are developed for use in estimating the relative PID stress associated with temperature, moisture, and system voltage in any climate. Current transfer in a framed crystalline silicon module is relatively high when there is no condensed water on the module, whereas current transfer in a thin-film module held by edge clips is not, and displays a greater fraction of coulombs transferred when wet compared to the framed module in the natural environment.
Research Organization:
NREL (National Renewable Energy Laboratory (NREL), Golden, CO (United States))
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
DOE Contract Number:
AC36-08GO28308
OSTI ID:
1343664
Report Number(s):
NREL/CP-5J00-65812
Country of Publication:
United States
Language:
English

Similar Records

Field Study of Nighttime Leakage Currents in Bifacial PV Modules: Correlation with Atmospheric Electric Field Data
Conference · Sun Jun 09 00:00:00 EDT 2024 · 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) · OSTI ID:2503473

Prediction of Potential-Induced Degradation Rate of Thin-Film Modules in the Field Based on Coulombs Transferred
Conference · Wed Nov 28 23:00:00 EST 2018 · OSTI ID:1507666

Using Meteorological Data to Evaluate Worldwide PV Degradation Rates
Conference · Tue Mar 24 00:00:00 EDT 2020 · OSTI ID:1606134