Band Excitation for Scanning Probe Microscopy
The Band Excitation (BE) technique for scanning probe microscopy uses a precisely determined waveform that contains specific frequencies to excite the cantilever or sample in an atomic force microscope to extract more information, and more reliable information from a sample. There are a myriad of details and complexities associated with implementing the BE technique. There is therefore a need to have a user friendly interface that allows typical microscopists access to this methodology. This software enables users of atomic force microscopes to easily: build complex band-excitation waveforms, set-up the microscope scanning conditions, configure the input and output electronics for generate the waveform as a voltage signal and capture the response of the system, perform analysis on the captured response, and display the results of the measurement.
- Short Name / Acronym:
- Band Excitation for Scanning Probe Microscopy; 005131IBMPC00
- Version:
- 00
- Programming Language(s):
- Medium: X; OS: Windows 7
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE
- Contributing Organization:
- Stephen Jesse
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1340998
- Country of Origin:
- United States
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Band excitation method applicable to scanning probe microscopy
Band excitation method applicable to scanning probe microscopy