Nm-scale spatial resolution x-ray imaging with MLL nanofocusing optics: instrumentational requirements and challenges

Technical Report · Tue Aug 30 04:00:00 EDT 2016

DOI:https://doi.org/10.2172/1340392· OSTI ID:1340392

Nazaretski, E. ^[1]; Yan, H. ^[1]; Lauer, K. ^[1]; Huang, X. ^[1]; Xu, W. ^[1]; Kalbfleisch, S. ^[1]; Yan, Hui ^[1]; Li, Li ^[1]; Bouet, N. ^[1]; Zhou, J. ^[1]; Shu, D. ^[2]; Conley, R. ^[2]; Chu, Y. S. ^[1]

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1. Brookhaven National Lab. (BNL), Upton, NY (United States)
2. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source

The Hard X-ray Nanoprobe (HXN) beamline at NSLS-II has been designed and constructed to enable imaging experiments with unprecedented spatial resolution and detection sensitivity. The HXN X-ray Microscope is a key instrument for the beamline, providing a suite of experimental capabilities which includes scanning fluorescence, diffraction, differential phase contrast and ptychography utilizing Multilayer Laue Lenses (MLL) and zoneplate (ZP) as nanofocusing optics. In this paper, we present technical requirements for the MLL-based scanning microscope, outline the development concept and present first ~15 x 15 nm² spatial resolution x-ray fluorescence images.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
• Contributing Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• DOE Contract Number: SC0012704; AC02-98CH10886
• OSTI ID: 1340392
• Report Number(s): BNL--112622-2016-JA
• Country of Publication: United States
• Language: English

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