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Title: Comparative STEREO-LID (spatio-temporally resolved optical laser-induced damage) studies of critical defect distributions in IBS ALD and electron-beam coated dielectric films.

Conference ·
OSTI ID:1336347

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1336347
Report Number(s):
SAND2015-8721C; 615265
Resource Relation:
Conference: Proposed for presentation at the SPIE Laser Damage Symposium held September 27-30, 2015 in Boulder, CO.
Country of Publication:
United States
Language:
English