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The Low Voltage TFET Demands Higher Perfection than Previously Required in Electronics.

Conference · Mon Jun 01 00:00:00 EDT 2015

DOI:https://doi.org/10.1109/DRC.2015.7175662· OSTI ID:1331604

Agarwal, Sapan; Yablonovitch, Eli ^[1]

UC Berkeley

Abstract not provided.

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: NSF

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1331604

Report Number(s):: SAND2015-4959C; 594393

Country of Publication:: United States

Language:: English

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