Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

A practical approach in substation capacitor bank applications to calculating, limiting, and reducing the effects of transient currents

Journal Article · · IEEE Transactions on Industry Applications
DOI:https://doi.org/10.1109/28.395277· OSTI ID:131560
 [1]
  1. Resource Management International, Inc., West Palm Beach, FL (United States)
When two or more capacitor banks are in parallel on a common bus, the back-to-back switching of a bank against one or more already energized banks can produce high peak transient in-rush current values. Typically, these currents can exceed the available fault current levels previously present at the bus. The presence of inductance and capacitance together makes the transients oscillatory. Because of close circuit coupling, the transient frequency is generally several kilohertz or higher and usually decays to zero in a fraction of a 60-Hz cycle. The relatively high level and short duration of these currents can damage substation and control equipment necessitating that appropriate precautions be taken during the design process. This paper explores the methods for estimating capacitor bank transient currents, based on ANSI/IEEE C37.012-1979, for various sizes, voltages, and configurations of real world capacitor bank installations. Also discussed are the various accepted and applied methods for limiting substation equipment susceptibility to transients, as well as reducing the magnitude of the transients themselves.
OSTI ID:
131560
Journal Information:
IEEE Transactions on Industry Applications, Journal Name: IEEE Transactions on Industry Applications Journal Issue: 4 Vol. 31; ISSN 0093-9994; ISSN ITIACR
Country of Publication:
United States
Language:
English

Similar Records

High frequency grounding analysis of capacitor bank switching
Conference · Sun Oct 01 00:00:00 EDT 1995 · OSTI ID:103777

Bridge capacitor bank design and operation
Journal Article · Sun Dec 31 23:00:00 EST 1995 · IEEE Transactions on Power Delivery · OSTI ID:218304

Use of EMTP to investigate capacitor bank de-energizing transients
Conference · Thu Oct 31 23:00:00 EST 1996 · OSTI ID:389874