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Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in TaOx Memristors.

Conference ·
OSTI ID:1315344
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Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1315344
Report Number(s):
SAND2014-15688C; 533648
Country of Publication:
United States
Language:
English

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