Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in TaOx Memristors.

Conference · Tue Jul 01 00:00:00 EDT 2014

OSTI ID:1315344

Hughart, David Russell; Pacheco, Jose L; Lohn, Andrew; Mickel, Patrick R.; Bielejec, Edward S.; Vizkelethy, Gyorgy; Doyle, Barney Lee; Wolfley, Steven L.; Dodd, Paul E.; Shaneyfelt, Marty R.; McLain, Michael Lee; Marinella, Matthew

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1315344
• Report Number(s): SAND2014-15688C; 533648
• Resource Relation: Conference: Proposed for presentation at the 2014 IEEE NSREC held July 14-18, 2014 in dsfdsfdsffs, France.
• Country of Publication: United States
• Language: English