Signal-to-noise in silicon microstrip detectors with binary readout

Journal Article · Tue Aug 01 00:00:00 EDT 1995 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.467803· OSTI ID:129166

DeWitt, J; Dorfan, D; Dubbs, T ^[1]

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1. Univ. of California, Santa Cruz, CA (United States)

The authors report the results of a beam test at KEK using double-sided AC-coupled silicon microstrip detectors with binary readout, i.e., a readout where the signals are discriminated in the front-end electronics and only the hit location is kept. For strip pitch between 50{micro} and 200{micro}, they determine the efficiency and the noise background as function of threshold setting. This allows them to reconstruct the Landau pulse height spectrum and determine the signal/noise ratio. In addition, the threshold/noise ratio necessary for operation with low occupancy is determined.

• OSTI ID: 129166
• Report Number(s): CONF-941061--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 4Pt1 Vol. 42; ISSN IETNAE; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ACCELERATORS
DISCRIMINATORS
EXPERIMENTAL DATA
PARTICLE TRACKS
READOUT SYSTEMS
SI SEMICONDUCTOR DETECTORS
SIGNAL-TO-NOISE RATIO