Partial electron ionization cross sections for molecules

Journal Article · Tue Dec 01 04:00:00 EST 1992 · Bulletin of the American Physical Society

OSTI ID:127912

Foltin, M; Winker, C; Grill, V ^[1]

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1. and others

Fragment ions produced by dissociative electron impact ionization often have large amounts of kinetic energy (up to several eV). Presently performed computer simulations of the ion trajectories in a Nier-type ion source show strong discrimination effects in the extraction characteristics of such ions. Using these results a correction function is calculated here for a given potential distribution of such a Nier type ion source extraction system. This correction function has been used to correct partial ionization cross sections measured with a modified Nier type ion source in combination with a double focusing sector field mass spectrometer. The obtained results for H{sub 2}, N{sub 2}, CF{sub 4}, SF{sub 6} and C{sub 3}H{sub 8} will be presented and their occuracy will be discussed using selected previous data for comparison.

• OSTI ID: 127912
• Report Number(s): CONF-920376--
• Journal Information: Bulletin of the American Physical Society, Journal Name: Bulletin of the American Physical Society Journal Issue: 9 Vol. 37; ISSN BAPSA6; ISSN 0003-0503
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
CARBON FLUORIDES
CROSS SECTIONS
ELECTRON-MOLECULE COLLISIONS
HYDROGEN
IONIZATION
NITROGEN
SULFUR FLUORIDES