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U.S. Department of Energy
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Impact of Interface Defects on Tunneling FET Turn-on Steepness.

Conference ·
OSTI ID:1262936
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
NSF
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1262936
Report Number(s):
SAND2015-5522C; 594852
Country of Publication:
United States
Language:
English

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