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Title: Soft X-ray spectromicroscopy and ptychography

Authors:
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1249971
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Journal of Electron Spectroscopy and Related Phenomena
Additional Journal Information:
Journal Name: Journal of Electron Spectroscopy and Related Phenomena Journal Volume: 200 Journal Issue: C; Journal ID: ISSN 0368-2048
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Hitchcock, Adam P. Soft X-ray spectromicroscopy and ptychography. Netherlands: N. p., 2015. Web. doi:10.1016/j.elspec.2015.05.013.
Hitchcock, Adam P. Soft X-ray spectromicroscopy and ptychography. Netherlands. doi:10.1016/j.elspec.2015.05.013.
Hitchcock, Adam P. Wed . "Soft X-ray spectromicroscopy and ptychography". Netherlands. doi:10.1016/j.elspec.2015.05.013.
@article{osti_1249971,
title = {Soft X-ray spectromicroscopy and ptychography},
author = {Hitchcock, Adam P.},
abstractNote = {},
doi = {10.1016/j.elspec.2015.05.013},
journal = {Journal of Electron Spectroscopy and Related Phenomena},
number = C,
volume = 200,
place = {Netherlands},
year = {Wed Apr 01 00:00:00 EDT 2015},
month = {Wed Apr 01 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1016/j.elspec.2015.05.013

Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

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