A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures
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journal
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August 2008 |
In-situ TEM Observations on the Sintering Process of Colloidal Gold Using an Ultra-fast Heating Stage
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journal
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August 2008 |
A MEMS-based Technology Platform for in-situ TEM Heating Studies
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journal
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August 2008 |
An in situ TEM study of phase formation in gold-aluminum couples
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journal
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January 2004 |
A newly developed high resolution hot stage and its application to materials characterization
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journal
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January 1993 |
In-situ high-resolution electron microscopy study on a surface reconstruction of Au-deposited Si at very high temperatures
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journal
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January 1997 |
Crystallization behaviour of ALD-Ta 2 O 5 thin films: the application of in-situ TEM
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journal
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June 2005 |
In situ Observation of Solid–liquid Interfaces by Transmission Electron Microscopy
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journal
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July 2005 |
In-situ TEM observation of transformation of dislocations from shuffle to glide sets in Si under supersaturation of interstitials
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journal
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October 2006 |
In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al
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journal
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July 2001 |
Direct Observation of Vapor−Liquid−Solid Nanowire Growth
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journal
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April 2001 |
Specimen heating and positioning device for an electron microscope
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patent
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July 1975 |
Miniature electrical probe
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patent
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January 1985 |
Anti-drift device for side entry electron microscope specimen holders
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patent
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October 1987 |
Scanning tunneling microscope
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patent
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February 1991 |
Specimen heating holder for electron microscopes
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patent
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February 1991 |
Test specimen/jaw assembly that exhibits both self-resistive and self-inductive heating in response to an alternating electrical current flowing therethrough
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patent
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April 1993 |
Double-layered ceramic heater
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patent
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July 1994 |
Electron microscope specimen holder
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patent
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November 1994 |
Hot grip assembly
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patent
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April 1996 |
Variable temperature scanning probe microscope based on a peltier device
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patent
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August 1997 |
Multi-dimensional capacitive transducer
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patent
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August 1997 |
Hot stage for scanning probe microscope
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patent
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March 1998 |
Heated stage for a scanning probe microscope
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patent
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October 1998 |
Multi-dimensional capacitive transducer
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patent
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February 1999 |
Adhesion strength testing using a depth-sensing indentation technique
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patent
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January 2002 |
Sample heating holder, method of observing a sample and charged particle beam apparatus
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patent
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December 2002 |
Test apparatus and method of measuring mar resistance of film or coating
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patent
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February 2003 |
Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems
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patent
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September 2007 |
Nanoindentation surface analysis tool and method
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patent
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November 2008 |
Measuring head for nanoindentation instrument and measuring method using same
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patent
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March 2010 |
Double tilt transmission electron microscope sample holder for in-situ measurement of microstructures
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patent
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October 2013 |
Indenter assembly
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patent
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January 2014 |
System and method for testing of bonds of a semiconductor assembly
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patent
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September 2014 |
Heat emitting probe and heat emitting probe apparatus
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patent-application
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August 2002 |
TEM MEMS device holder and method of fabrication
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patent-application
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February 2006 |
Technique for applying direct resistance heating current to a specific location in a specimen under test while substantially reducing thermal gradients in the specimen gauge length
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patent-application
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August 2006 |
Microfabricated Cantilever Chip
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patent-application
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December 2007 |
Methods of fabricating nanostructures and nanowires and devices fabricated therefrom
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patent-application
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April 2008 |
Mems Nanoindenter
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patent-application
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November 2008 |
Heating Stage For A Micro-Sample
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patent-application
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November 2008 |
Method Of Preparing A Substrate With A Composition Including An Organoborane Initiator
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patent-application
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April 2009 |
Nanoindentation Surface Analysis Method
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patent-application
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May 2009 |
Method And System For Measuring Properties Of Microstructures And Nanostructures
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patent-application
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August 2009 |
Electron Beam Observation Device Using Pre-Specimen Magnetic Field As Image-Forming Lens And Specimen Observation Method
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patent-application
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August 2009 |
Probe Card Thermal Conditioning System
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patent-application
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November 2009 |
Micro/Nano-Mechanical Test System Employing Tensile Test Holder With Push-To-Pull Transformer
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patent-application
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April 2010 |
Micromachined Comb Drive For Quantitative Nanoindentation
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patent-application
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June 2010 |
Nanoindenter
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patent-application
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July 2010 |
Microtesting Rig with Variable Compliance Loading Fibers for Measuring Mechanical Properties of Small Specimens
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patent-application
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July 2010 |
Tip Indenting Apparatus for Testing a Block of Material
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patent-application
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August 2010 |
Apparatus and methods for preparing identification features including pharmaceutical applications
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patent-application
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November 2010 |
Sensor For Quantitative Measurement Of Electromechanical Properties And Microstructure Of Nano-Materials And Method For Making The Same
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patent-application
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May 2011 |
Methods And Instruments For Assessing Bone Fracture Risk
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patent-application
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June 2011 |
Indenter Assembly
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patent-application
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October 2011 |
System And Method For Testing Of Bonds Of A Semiconductor Assembly
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patent-application
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November 2011 |
System And Method For Testing Of Bonds Of A Semiconductor Assembly
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patent-application
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November 2011 |
Probe Tip Heating Assembly
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patent-application
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November 2014 |
High Temperature Heating System
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patent-application
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November 2014 |
High Temperature Heating System
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patent-application
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February 2015 |
Microscopy Support Structures
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patent-application
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June 2015 |
Environmental Conditioning Assembly For Use In Mechanical Testing At Micron Or Nano-Scales
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patent-application
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July 2015 |