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Title: Strong geometrical effects in submillimeter selective area growth and light extraction of GaN light emitting diodes on sapphire

Journal Article · · Scientific Reports
DOI:https://doi.org/10.1038/srep17314· OSTI ID:1236206
 [1];  [1];  [2];  [1]
  1. Univ. of California, San Diego, La Jolla, CA (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Advanced semiconductor devices often utilize structural and geometrical effects to tailor their characteristics and improve their performance. Our detailed understanding of such geometrical effects in the epitaxial selective area growth of GaN on sapphire substrates is reported here, and we utilize them to enhance light extraction from GaN light emitting diodes. Systematic size and spacing effects were performed side-by-side on a single 2” sapphire substrate to minimize experimental sampling errors for a set of 144 pattern arrays with circular mask opening windows in SiO2. We show that the mask opening diameter leads to as much as 4 times increase in the thickness of the grown layers for 20 μm spacings and that spacing effects can lead to as much as 3 times increase in thickness for a 350 μm dot diameter. We also observed that the facet evolution in comparison with extracted Ga adatom diffusion lengths directly influences the vertical and lateral overgrowth rates and can be controlled with pattern geometry. Lastly, such control over the facet development led to 2.5 times stronger electroluminescence characteristics from well-faceted GaN/InGaN multiple quantum well LEDs compared to non-faceted structures.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1236206
Report Number(s):
SAND-2015-7621J; srep17314
Journal Information:
Scientific Reports, Vol. 5; ISSN 2045-2322
Publisher:
Nature Publishing GroupCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 34 works
Citation information provided by
Web of Science

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Structural and electrical characterization of thick GaN layers on Si, GaN, and engineered substrates journal February 2019
GaN Micropillar Schottky Diodes with High Breakdown Voltage Fabricated by Selective‐Area Growth text January 2019
Indium Incorporation into InGaN Quantum Wells Grown on GaN Narrow Stripes journal August 2019
GaN Micropillar Schottky Diodes with High Breakdown Voltage Fabricated by Selective‐Area Growth journal October 2019
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