Performance of bent-crystal x-ray microscopes for high energy density physics research

Schollmeier, Marius S.; Geissel, Matthias; Shores, Jonathon E.; Smith, Ian C.; Porter, John L.

doi:10.1364/AO.54.005147

Performance of bent-crystal x-ray microscopes for high energy density physics research

Journal Article · Fri May 29 00:00:00 EDT 2015 · Applied Optics

DOI:https://doi.org/10.1364/AO.54.005147· OSTI ID:1235279

Schollmeier, Marius S. ^[1]; Geissel, Matthias ^[1]; Shores, Jonathon E. ^[1]; Smith, Ian C. ^[1]; Porter, John L. ^[1]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. Furthermore, the analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. We discovered that this enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to find the best compromise between FOV, image fluence, and spatial resolution for a particular application.

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC04-94AL85000

OSTI ID:: 1235279

Alternate ID(s):: OSTI ID: 1222278

Report Number(s):: SAND--2015-3775J; 583836

Journal Information:: Applied Optics, Journal Name: Applied Optics Journal Issue: 16 Vol. 54; ISSN 0003-6935; ISSN APOPAI

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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