Full information acquisition in piezoresponse force microscopy

Somnath, Suhas; Belianinov, Alex; Jesse, Stephen; Kalinin, Sergei V.

doi:10.1063/1.4938482

Full information acquisition in piezoresponse force microscopy

Journal Article · Sun Dec 27 23:00:00 EST 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4938482· OSTI ID:1235834

Somnath, Suhas ^[1]; Belianinov, Alex ^[1]; Jesse, Stephen ^[1]; Kalinin, Sergei V. ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1235834

Alternate ID(s):: OSTI ID: 1234028
OSTI ID: 22486314

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 26 Vol. 107; ISSN APPLAB; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

References (27)

Ferroelectric domain switching dynamics with combined 20 nm and 10 ns resolution Polomoff, Nicholas A.; Premnath, Ramesh Nath; Bosse, James L. Journal of Materials Science, Vol. 44, Issue 19 https://doi.org/10.1007/s10853-009-3699-x	journal	October 2009
Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images Bosman, M.; Watanabe, M.; Alexander, D. T. L. Ultramicroscopy, Vol. 106, Issue 11-12, p. 1024-1032 https://doi.org/10.1016/j.ultramic.2006.04.016	journal	October 2006
Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution Balke, Nina; Jesse, Stephen; Kim, Yoongu Nano Letters, Vol. 10, Issue 9 https://doi.org/10.1021/nl101439x	journal	September 2010
Direct Mapping of Ionic Transport in a Si Anode on the Nanoscale: Time Domain Electrochemical Strain Spectroscopy Study Jesse, Stephen; Balke, Nina; Eliseev, Eugene ACS Nano, Vol. 5, Issue 12 https://doi.org/10.1021/nn203141g	journal	November 2011
Complete information acquisition in dynamic force microscopy Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms7550	journal	March 2015
Molecular ferroelectrics: where electronics meet biology Li, Jiangyu; Liu, Yuanming; Zhang, Yanhang Physical Chemistry Chemical Physics, Vol. 15, Issue 48 https://doi.org/10.1039/c3cp52501e	journal	January 2013
Multivariate statistical methods for the analysis of microscope image series: applications in materials science Bonnet, N. Journal of Microscopy, Vol. 190, Issue 1‐2 https://doi.org/10.1046/j.1365-2818.1998.3250876.x	journal	April 1998
Role of 90° domains in lead zirconate titanate thin films Ganpule, C. S.; Nagarajan, V.; Li, H. Applied Physics Letters, Vol. 77, Issue 2 https://doi.org/10.1063/1.126954	journal	July 2000
Contact resonances in voltage-modulated force microscopy Harnagea, C.; Alexe, M.; Hesse, D. Applied Physics Letters, Vol. 83, Issue 2 https://doi.org/10.1063/1.1592307	journal	July 2003
Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors Dehoff, C.; Rodriguez, B. J.; Kingon, A. I. Review of Scientific Instruments, Vol. 76, Issue 2 https://doi.org/10.1063/1.1850652	journal	February 2005
High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging Nath, Ramesh; Chu, Ying-Hao; Polomoff, Nicholas A. Applied Physics Letters, Vol. 93, Issue 7, Article No. 072905 https://doi.org/10.1063/1.2969045	journal	August 2008
Electromechanical probing of ionic currents in energy storage materials Morozovska, A. N.; Eliseev, E. A.; Kalinin, S. V. Applied Physics Letters, Vol. 96, Issue 22 https://doi.org/10.1063/1.3446838	journal	May 2010
Band excitation in scanning probe microscopy: sines of change Jesse, Stephen; Kalinin, Sergei V. Journal of Physics D: Applied Physics, Vol. 44, Issue 46 https://doi.org/10.1088/0022-3727/44/46/464006	journal	November 2011
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger Nanotechnology, Vol. 18, Issue 43 https://doi.org/10.1088/0957-4484/18/43/435503	journal	September 2007
Dual-frequency resonance-tracking atomic force microscopy Rodriguez, Brian J.; Callahan, Clint; Kalinin, Sergei V. Nanotechnology, Vol. 18, Issue 47, Article No. 475504 https://doi.org/10.1088/0957-4484/18/47/475504	journal	October 2007
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. Nanotechnology, Vol. 20, Issue 8 https://doi.org/10.1088/0957-4484/20/8/085714	journal	February 2009
Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy Jesse, S.; Guo, S.; Kumar, A. Nanotechnology, Vol. 21, Issue 40 https://doi.org/10.1088/0957-4484/21/40/405703	journal	September 2010
Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control Gruverman, A.; Auciello, O.; Ramesh, R. Nanotechnology, Vol. 8, Issue 3A https://doi.org/10.1088/0957-4484/8/3A/008	journal	September 1997
A decade of piezoresponse force microscopy: progress, challenges, and opportunities Kalinin, Sergei; Rar, Andrei; Jesse, Stephen IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Vol. 53, Issue 12 https://doi.org/10.1109/TUFFC.2006.169	journal	December 2006
Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future Balke, Nina; Bdikin, Igor; Kalinin, Sergei V. Journal of the American Ceramic Society, Vol. 92, Issue 8 https://doi.org/10.1111/j.1551-2916.2009.03240.x	journal	August 2009
Scanning Force Microscopy Studies of Domain Structure in B a T i O ₃ Single Crystals Gruverman, Alexei L.; Hatano, Jun; Tokumoto, Hiroshi Japanese Journal of Applied Physics, Vol. 36, Issue Part 1, No. 4A https://doi.org/10.1143/JJAP.36.2207	journal	April 1997
Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy Gruverman, Alexei; Auciello, Orlando; Tokumoto, Hiroshi Annual Review of Materials Science, Vol. 28, Issue 1 https://doi.org/10.1146/annurev.matsci.28.1.101	journal	August 1998
Nanoscale Electromechanics of Ferroelectric and Biological Systems: A New Dimension in Scanning Probe Microscopy Kalinin, Sergei V.; Rodriguez, Brian J.; Jesse, Stephen Annual Review of Materials Research, Vol. 37, Issue 1 https://doi.org/10.1146/annurev.matsci.37.052506.084323	journal	August 2007
Electromechanics on the Nanometer Scale: Emerging Phenomena, Devices, and Applications Kalinin, Sergei V.; Setter, Nava; Kholkin, Andrei L. MRS Bulletin, Vol. 34, Issue 9 https://doi.org/10.1557/mrs2009.174	journal	September 2009
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Bonnell, D. A.; Kalinin, S. V.; Kholkin, A. L. MRS Bulletin, Vol. 34, Issue 9 https://doi.org/10.1557/mrs2009.176	journal	September 2009
Electromechanical Probing of Ionic Currents in Energy Storage Materials Morozovska, A. N.; Eliseev, E. A.; Kalinin, S. V. arXiv https://doi.org/10.48550/arxiv.1002.0961	text	January 2010
A Decade of Piezoresponse Force Microscopy: Progress, Challenges and Opportunities Kalinin, Sergei V.; Rar, Andrei; Jesse, Stephen arXiv https://doi.org/10.48550/arxiv.cond-mat/0509009	text	January 2005

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G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics Collins, Liam; Belianinov, Alex; Proksch, Roger Applied Physics Letters, Vol. 108, Issue 19 https://doi.org/10.1063/1.4948601	journal	May 2016
Tutorial: Product properties in multiferroic nanocomposites Viehland, Dwight; Li, Jie Fang; Yang, Yaodong Journal of Applied Physics, Vol. 124, Issue 6 https://doi.org/10.1063/1.5038726	journal	August 2018
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018
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Materials science in the artificial intelligence age: high-throughput library generation, machine learning, and a pathway from correlations to the underpinning physics Vasudevan, Rama K.; Choudhary, Kamal; Mehta, Apurva MRS Communications, Vol. 9, Issue 3 https://doi.org/10.1557/mrc.2019.95	journal	July 2019

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