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Title: Time resolved photo-luminescent decay characterization of mercury cadmium telluride focal plane arrays

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/OE.23.001256· OSTI ID:1214218
 [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

The minority carrier lifetime is a measurable material property that is an indication of infrared detector device performance. To study the utility of measuring the carrier lifetime, an experiment has been constructed that can time resolve the photo-luminescent decay of a detector or wafer sample housed inside a liquid nitrogen cooled Dewar. Motorized stages allow the measurement to be scanned over the sample surface, and spatial resolutions as low as 50µm have been demonstrated. A carrier recombination simulation was developed to analyze the experimental data. Results from measurements performed on 4 mercury cadmium telluride focal plane arrays show strong correlation between spatial maps of the lifetime, dark current, and relative response.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1214218
Alternate ID(s):
OSTI ID: 1214777
Journal Information:
Optics Express, Vol. 23, Issue 2; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 3 works
Citation information provided by
Web of Science