X-ray imaging for studying behavior of liquids at high pressures and high temperatures using Paris-Edinburgh press

Kono, Yoshio; Kenney-Benson, Curtis; Shibazaki, Yuki; Park, Changyong; Wang, Yanbin; Shen, Guoyin

doi:10.1063/1.4927227

Title: X-ray imaging for studying behavior of liquids at high pressures and high temperatures using Paris-Edinburgh press

Journal Article · Thu Jul 23 00:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4927227· OSTI ID:1203749

Kono, Yoshio ^[1];

^[1]; Shibazaki, Yuki ^[2]; Park, Changyong ^[1]; Wang, Yanbin ^[3]; Shen, Guoyin ^[1]

Carnegie Inst. of Washington, Argonne, IL (United States). High Pressure Collaborative Access Team (HPCAT)
Tohoku Univ., Sendai (Japan)
Univ. of Chicago, IL (United States)

Several X-ray techniques for studying structure, elastic properties, viscosity, and immiscibility of liquids at high pressures have been integrated using a Paris-Edinburgh press at the 16-BM-B beamline of the Advanced Photon Source. In this paper, we report the development of X-ray imaging techniques suitable for studying behavior of liquids at high pressures and high temperatures. White X-ray radiography allows for imaging phase separation and immiscibility of melts at high pressures, identified not only by density contrast but also by phase contrast imaging in particular for low density contrast liquids such as silicate and carbonate melts. In addition, ultrafast X-ray imaging, at frame rates up to ~10⁵ frames/second (fps) in air and up to ~10⁴ fps in Paris-Edinburgh press, enables us to investigate dynamics of liquids at high pressures. Very low viscosities of melts similar to that of water can be reliably measured. These high-pressure X-ray imaging techniques provide useful tools for understanding behavior of liquids or melts at high pressures and high temperatures.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE National Nuclear Security Administration (NNSA); National Science Foundation (NSF)

Grant/Contract Number:: FG02-99ER45775; NA0001974; AC02-06CH11357; FG02-94ER14466; EAR-1214376

OSTI ID:: 1203749

Alternate ID(s):: OSTI ID: 1228698

Journal Information:: Review of Scientific Instruments, Vol. 86, Issue 7; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: ENGLISH

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Cited by: 10 works

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