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Title: Method for determining formation quality factor from seismic data

Abstract

A method is disclosed for calculating the quality factor Q from a seismic data trace. The method includes calculating a first and a second minimum phase inverse wavelet at a first and a second time interval along the seismic data trace, synthetically dividing the first wavelet by the second wavelet, Fourier transforming the result of the synthetic division, calculating the logarithm of this quotient of Fourier transforms and determining the slope of a best fit line to the logarithm of the quotient.

Inventors:
;
Publication Date:
Research Org.:
RDSPI, L.P., Houston, TX (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1175471
Patent Number(s):
6,931,324
Application Number:
10/687,129
Assignee:
RDSPI, L.P. (Houston, TX)
DOE Contract Number:  
FC26-01BC15356
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
97 MATHEMATICS AND COMPUTING

Citation Formats

Taner, M. Turhan, and Treitel, Sven. Method for determining formation quality factor from seismic data. United States: N. p., 2005. Web.
Taner, M. Turhan, & Treitel, Sven. Method for determining formation quality factor from seismic data. United States.
Taner, M. Turhan, and Treitel, Sven. Tue . "Method for determining formation quality factor from seismic data". United States. https://www.osti.gov/servlets/purl/1175471.
@article{osti_1175471,
title = {Method for determining formation quality factor from seismic data},
author = {Taner, M. Turhan and Treitel, Sven},
abstractNote = {A method is disclosed for calculating the quality factor Q from a seismic data trace. The method includes calculating a first and a second minimum phase inverse wavelet at a first and a second time interval along the seismic data trace, synthetically dividing the first wavelet by the second wavelet, Fourier transforming the result of the synthetic division, calculating the logarithm of this quotient of Fourier transforms and determining the slope of a best fit line to the logarithm of the quotient.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2005},
month = {8}
}

Patent:

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