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Title: Continuous time-of-flight ion mass spectrometer

Abstract

A continuous time-of-flight mass spectrometer having an evacuated enclosure with means for generating an electric field located in the evacuated enclosure and means for injecting a sample material into the electric field. A source of continuous ionizing radiation injects ionizing radiation into the electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between arrival of a secondary electron out of said ionized atoms or molecules at a first predetermined location and arrival of a sample ion out of said ionized atoms or molecules at a second predetermined location.

Inventors:
;
Publication Date:
Research Org.:
Univ. of California, Oakland, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1175089
Patent Number(s):
6,806,467
Application Number:
10/625,935
Assignee:
The Regents of the University of California (Los Alamos, NM)
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 74 ATOMIC AND MOLECULAR PHYSICS

Citation Formats

Funsten, Herbert O., and Feldman, William C. Continuous time-of-flight ion mass spectrometer. United States: N. p., 2004. Web.
Funsten, Herbert O., & Feldman, William C. Continuous time-of-flight ion mass spectrometer. United States.
Funsten, Herbert O., and Feldman, William C. Tue . "Continuous time-of-flight ion mass spectrometer". United States. https://www.osti.gov/servlets/purl/1175089.
@article{osti_1175089,
title = {Continuous time-of-flight ion mass spectrometer},
author = {Funsten, Herbert O. and Feldman, William C.},
abstractNote = {A continuous time-of-flight mass spectrometer having an evacuated enclosure with means for generating an electric field located in the evacuated enclosure and means for injecting a sample material into the electric field. A source of continuous ionizing radiation injects ionizing radiation into the electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between arrival of a secondary electron out of said ionized atoms or molecules at a first predetermined location and arrival of a sample ion out of said ionized atoms or molecules at a second predetermined location.},
doi = {},
url = {https://www.osti.gov/biblio/1175089}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2004},
month = {10}
}

Patent:

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