Process for growing epitaxial gallium nitride and composite wafers
Patent
·
OSTI ID:1174323
A novel growth procedure to grow epitaxial Group III metal nitride thin films on lattice-mismatched substrates is proposed. Demonstrated are the quality improvement of epitaxial GaN layers using a pure metallic Ga buffer layer on c-plane sapphire substrate. X-ray rocking curve results indicate that the layers had excellent structural properties. The electron Hall mobility increases to an outstandingly high value of .mu.>400 cm.sup.2 /Vs for an electron background concentration of 4.times.10.sup.17 cm.sup.-3.
- Research Organization:
- Univ. of California, Oakland, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC03-76F00098
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Number(s):
- 6,563,144
- Application Number:
- 09/824,843
- OSTI ID:
- 1174323
- Country of Publication:
- United States
- Language:
- English
Similar Records
Improved heteroepitaxial MBE GaN growth with a Ga metal buffer layer
Gallium nitride thick layers: Epitaxial growth and separation from substrates
Gas source molecular beam epitaxy of scandium nitride on silicon carbide and gallium nitride surfaces
Conference
·
Mon May 15 00:00:00 EDT 2000
·
OSTI ID:1174323
+8 more
Gallium nitride thick layers: Epitaxial growth and separation from substrates
Book
·
Wed Dec 31 00:00:00 EST 1997
·
OSTI ID:1174323
+4 more
Gas source molecular beam epitaxy of scandium nitride on silicon carbide and gallium nitride surfaces
Journal Article
·
Sat Nov 01 00:00:00 EDT 2014
· Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
·
OSTI ID:1174323