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A Pixel Readout Chip in 40 nm CMOS Process for High Count Rate Imaging Systems with Minimization of Charge Sharing Effects

Conference · · NSS/MIC 2013 Proceedings

We present a prototype chip in 40 nm CMOS technology for readout of hybrid pixel detector. The prototype chip has a matrix of 18x24 pixels with a pixel pitch of 100 μm. It can operate both in single photon counting (SPC) mode and in C8P1 mode. In SPC the measured ENC is 84 erms (for the peaking time of 48 ns), while the effective offset spread is below 2 mV rms. In the C8P1 mode the chip reconstructs full charge deposited in the detector, even in the case of charge sharing, and it identifies a pixel with the largest charge deposition. The chip architecture and preliminary measurements are reported.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Contributing Organization:
Pixels Collaboration
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1151753
Report Number(s):
FERMILAB--PUB-13-518-PPD
Journal Information:
NSS/MIC 2013 Proceedings, Journal Name: NSS/MIC 2013 Proceedings Vol. C13-10-26
Country of Publication:
United States
Language:
English

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