Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch.
Journal Article
·
· IEEE Transactions on Nuclear Science, Dec. 2007
OSTI ID:1147193
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- DE-AC04-94AL85000
- OSTI ID:
- 1147193
- Report Number(s):
- SAND2007-4745J; 522097
- Journal Information:
- IEEE Transactions on Nuclear Science, Dec. 2007, Related Information: Proposed for publication in IEEE Transactions on Nuclear Science, Dec. 2007.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains.
Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains.
A Radiation Hardened by Design FPGA with Distributed Single Event Upset Sensors, Embedded Error Handler, and 8Mb Embedded MRAM Configuration Storage in 22nm Bulk FinFET CMOS.
Journal Article
·
Mon Aug 01 00:00:00 EDT 2011
· IEEE Transactions on Nuclear Science
·
OSTI ID:1147193
+7 more
Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains.
Conference
·
Tue Feb 01 00:00:00 EST 2011
·
OSTI ID:1147193
+4 more
A Radiation Hardened by Design FPGA with Distributed Single Event Upset Sensors, Embedded Error Handler, and 8Mb Embedded MRAM Configuration Storage in 22nm Bulk FinFET CMOS.
Conference
·
Fri Jul 01 00:00:00 EDT 2022
·
OSTI ID:1147193
+1 more