Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains.

Dodd, Paul E.; Shaneyfelt, Marty R.; Flores, Richard S.; Schwank, James R.; Hill, Thomas A.; Vizkelethy, Gyorgy; Swanson, Scot E.; Jorgensen, J. L.; McMorrow, D.; Dalton, S. M.

doi:10.1109/TNS.2011.2169683

Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains.

Journal Article · Mon Aug 01 00:00:00 EDT 2011 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/TNS.2011.2169683· OSTI ID:1106989

Dodd, Paul E.; Shaneyfelt, Marty R.; Flores, Richard S.; Schwank, James R.; Hill, Thomas A.; Vizkelethy, Gyorgy; Swanson, Scot E.; Jorgensen, J. L.; McMorrow, D.; Dalton, S. M.

Abstract not provided.

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1106989

Report Number(s):: SAND2011-5789J; 464222

Journal Information:: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6 Vol. 58; ISSN 0018-9499

Country of Publication:: United States

Language:: English

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