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Highly Nonlinear Defect-Induced Carrier Recombination Rates in Semiconductors.

Journal Article · · Physical Review B
DOI:https://doi.org/10.1063/1.4824065· OSTI ID:1145249

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1145249
Report Number(s):
SAND2013-1984J; 442378
Journal Information:
Physical Review B, Journal Name: Physical Review B
Country of Publication:
United States
Language:
English

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