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Simulations of Radiation Dose-Rate Sensitivity of Bipolar Transistors.

Journal Article · · IEEE Transactions on Nuclear Science
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1143112
Report Number(s):
SAND2008-4997J; 516980
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6 Vol. 55; ISSN 0018-9499
Country of Publication:
United States
Language:
English

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