Sub-microsecond-resolution probe microscopy

Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

Sub-microsecond-resolution probe microscopy

Patent · 01 April 2014

OSTI ID:1128706

Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

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Research Organization:: University of Washington, Seattle, WA (United States). Center for Commercialization

Sponsoring Organization:: USDOE

DOE Contract Number:: SC0001084

Assignee:: University of Washington through its Center for Commercialization (Seattle, WA)

Patent Number(s):: 8,686,358

Application Number:: 13/232,859

OSTI ID:: 1128706

Country of Publication:: United States

Language:: English

References (38)

Time-resolved spectroscopy of single molecules using near-field and far-field optics Trautman, J. K.; Macklin, J. J. Chemical Physics, Vol. 205, Issue 1-2, p. 221-229 https://doi.org/10.1016/0301-0104(95)00391-6	journal	April 1996
Experimental determination of the rate law for charge carrier decay in a polythiophene: Fullerene solar cell Shuttle, C. G.; O’Regan, B.; Ballantyne, A. M. Applied Physics Letters, Vol. 92, Issue 9 https://doi.org/10.1063/1.2891871	journal	March 2008
Scanned-probe detection of electron spin resonance from a nitroxide spin probe Moore, Eric W.; Lee, SangGap; Hickman, Steven A. Proceedings of the National Academy of Sciences, Vol. 106, Issue 52, p. 22251-22256 https://doi.org/10.1073/pnas.0908120106	journal	December 2009
Nanoscale Morphology of High-Performance Polymer Solar Cells Yang, Xiaoniu; Loos, Joachim; Veenstra, Sjoerd C. Nano Letters, Vol. 5, Issue 4, p. 579-583 https://doi.org/10.1021/nl048120i	journal	April 2005
Inverting dynamic force microscopy: From signals to time-resolved interaction forces Stark, M.; Stark, R. W.; Heckl, W. M. Proceedings of the National Academy of Sciences, Vol. 99, Issue 13, p. 8473-8478 https://doi.org/10.1073/pnas.122040599	journal	June 2002
Adaptive control of force microscope cantilever dynamics Jensen, S. E.; Dougherty, W. M.; Garbini, J. L. Journal of Applied Physics, Vol. 102, Issue 5 https://doi.org/10.1063/1.2775867	journal	September 2007
High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes Ando, Toshio; Uchihashi, Takayuki; Fukuma, Takeshi Progress in Surface Science, Vol. 83, Issue 7-9, p. 337-437 https://doi.org/10.1016/j.progsurf.2008.09.001	journal	November 2008
Femtosecond pump-probe near-field optical microscopy Nechay, B. A.; Siegner, U.; Achermann, M. Review of Scientific Instruments, Vol. 70, Issue 6 https://doi.org/10.1063/1.1149841	journal	June 1999
Characterizing Morphology in Bulk Heterojunction Organic Photovoltaic Systems Giridharagopal, Rajiv; Ginger, David S. The Journal of Physical Chemistry Letters, Vol. 1, Issue 7 https://doi.org/10.1021/jz100100p	journal	March 2010
Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions Belaidi, S.; Girard, P.; Leveque, G. Journal of Applied Physics, Vol. 81, Issue 3 https://doi.org/10.1063/1.363884	journal	February 1997
Imaging of nanoscale charge transport in bulk heterojunction solar cells Hamadani, Behrang H.; Gergel-Hackett, Nadine; Haney, Paul M. Journal of Applied Physics, Vol. 109, Issue 12 https://doi.org/10.1063/1.3595669	journal	June 2011
Radio-frequency scanning tunnelling microscopy Kemiktarak, U.; Ndukum, T.; Schwab, K. C. Nature, Vol. 450, Issue 7166 https://doi.org/10.1038/nature06238	journal	November 2007
An atomic force microscope tip designed to measure time-varying nanomechanical forces Sahin, Ozgur; Magonov, Sergei; Su, Chanmin Nature Nanotechnology, Vol. 2, Issue 8 https://doi.org/10.1038/nnano.2007.226	journal	July 2007
Resolution enhancement and improved data interpretation in electrostatic force microscopy Colchero, J.; Gil, A.; Baró, A. M. Physical Review B, Vol. 64, Issue 24 https://doi.org/10.1103/PhysRevB.64.245403	journal	November 2001
Estimating and interpreting the instantaneous frequency of a signal. I. Fundamentals Boashash, B. Proceedings of the IEEE, Vol. 80, Issue 4 https://doi.org/10.1109/5.135376	journal	April 1992
Ultrafast scanning probe microscopy Weiss, S.; Ogletree, D. F.; Botkin, D. Applied Physics Letters, Vol. 63, Issue 18 https://doi.org/10.1063/1.110435	journal	November 1993
Real-Time Measurements of Conductance Switching and Motion of Single Oligo(phenylene ethynylene) Molecules Moore, Amanda M.; Mantooth, Brent A.; Donhauser, Zachary J. Journal of the American Chemical Society, Vol. 129, Issue 34 https://doi.org/10.1021/ja0745153	journal	August 2007
Spatially resolved femtosecond time correlation measurements on a GaAsP photodiode Schade, Wolfgang; Preusser, Jan; Osborn, David L. Optics Communications, Vol. 162, Issue 4-6, p. 200-204 https://doi.org/10.1016/S0030-4018(99)00115-7	journal	April 1999
Single spin detection by magnetic resonance force microscopy Rugar, D.; Budakian, R.; Mamin, H. J. Nature, Vol. 430, Issue 6997 https://doi.org/10.1038/nature02658	journal	July 2004
Noncontact estimation of intercellular breaking force using a femtosecond laser impulse quantified by atomic force microscopy Hosokawa, Yoichiroh; Hagiyama, Man; Iino, Takanori Proceedings of the National Academy of Sciences, Vol. 108, Issue 5, p. 1777-1782 https://doi.org/10.1073/pnas.1006847108	journal	January 2011
Quantifying Electric Field Gradient Fluctuations over Polymers Using Ultrasensitive Cantilevers Yazdanian, Showkat M.; Hoepker, Nikolas; Kuehn, Seppe Nano Letters, Vol. 9, Issue 6 https://doi.org/10.1021/nl9004332	journal	June 2009
Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity Albrecht, T. R.; Grütter, P.; Horne, D. Journal of Applied Physics, Vol. 69, Issue 2 https://doi.org/10.1063/1.347347	journal	January 1991
Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces Kalinin, Sergei V.; Bonnell, Dawn A. Physical Review B, Vol. 65, Issue 12 https://doi.org/10.1103/PhysRevB.65.125408	journal	March 2002
Real-space imaging of transient carrier dynamics by nanoscale pump–probe microscopy Terada, Yasuhiko; Yoshida, Shoji; Takeuchi, Osamu Nature Photonics, Vol. 4, Issue 12 https://doi.org/10.1038/nphoton.2010.235	journal	October 2010
Scanning Kelvin Probe Microscopy on Bulk Heterojunction Polymer Blends Maturová, Klára; Kemerink, Martijn; Wienk, Martijn M. Advanced Functional Materials, Vol. 19, Issue 9 https://doi.org/10.1002/adfm.200801283	journal	May 2009
Charge Photogeneration in Organic Solar Cells Clarke, Tracey M.; Durrant, James R. Chemical Reviews, Vol. 110, Issue 11, p. 6736-6767 https://doi.org/10.1021/cr900271s	journal	November 2010
Nanostructure determines the intensity-dependence of open-circuit voltage in plastic solar cells Reid, Obadiah G.; Xin, Hao; Jenekhe, Samson A. Journal of Applied Physics, Vol. 108, Issue 8 https://doi.org/10.1063/1.3482009	journal	October 2010
Microsecond atomic force sensing of protein conformational dynamics: Implications for the primary light-induced events in bacteriorhodopsin Rousso, I.; Khachatryan, E.; Gat, Y. Proceedings of the National Academy of Sciences, Vol. 94, Issue 15 https://doi.org/10.1073/pnas.94.15.7937	journal	July 1997
Imaging the Evolution of Nanoscale Photocurrent Collection and Transport Networks during Annealing of Polythiophene/Fullerene Solar Cells Pingree, Liam S. C.; Reid, Obadiah G.; Ginger, David S. Nano Letters, Vol. 9, Issue 8 https://doi.org/10.1021/nl901358v	journal	August 2009
Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene Jaquith, Michael; Muller, Erik M.; Marohn, John A. The Journal of Physical Chemistry B, Vol. 111, Issue 27 https://doi.org/10.1021/jp073626l	journal	July 2007
Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging Reid, Obadiah G.; Rayermann, Glennis E.; Coffey, David C. The Journal of Physical Chemistry C, Vol. 114, Issue 48 https://doi.org/10.1021/jp1056607	journal	October 2010
Ultrafast voltage-contrast scanning probe microscopy Ho, F.; Hou, A. S.; Nechay, B. A. Nanotechnology, Vol. 7, Issue 4 https://doi.org/10.1088/0957-4484/7/4/014	journal	December 1996
Mapping Local Photocurrents in Polymer/Fullerene Solar Cells with Photoconductive Atomic Force Microscopy Coffey, David C.; Reid, Obadiah G.; Rodovsky, Deanna B. Nano Letters, Vol. 7, Issue 3, p. 738-744 https://doi.org/10.1021/nl062989e	journal	March 2007
New SPM techniques for analyzing OPV materials Giridharagopal, Rajiv; Shao, Guozheng; Groves, Chris Materials Today, Vol. 13, Issue 9, p. 50-56 https://doi.org/10.1016/S1369-7021(10)70165-6	journal	September 2010
Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution Balke, Nina; Jesse, Stephen; Kim, Yoongu Nano Letters, Vol. 10, Issue 9 https://doi.org/10.1021/nl101439x	journal	September 2010
Measurement of Fast Electron Spin Relaxation Times with Atomic Resolution Loth, S.; Etzkorn, M.; Lutz, C. P. Science, Vol. 329, Issue 5999 https://doi.org/10.1126/science.1191688	journal	September 2010
Dielectric fluctuations in force microscopy: Noncontact friction and frequency jitter Yazdanian, Showkat M.; Marohn, John A.; Loring, Roger F. The Journal of Chemical Physics, Vol. 128, Issue 22 https://doi.org/10.1063/1.2932254	journal	June 2008
Time-resolved electrostatic force microscopy of polymer solar cells Coffey, David C.; Ginger, David S. Nature Materials, Vol. 5, Issue 9 https://doi.org/10.1038/nmat1712	journal	August 2006

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