Quantitative Analysis for Hillock Grown from Electroplated Sn Film.
Journal Article
·
· J. Applied Physics
OSTI ID:1123533
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1123533
- Report Number(s):
- SAND2010-3401J; 492393
- Journal Information:
- J. Applied Physics, Journal Name: J. Applied Physics
- Country of Publication:
- United States
- Language:
- English
Similar Records
A Mechanism for Hillock Formation over Electrodeposited Thin Tin Films.
Quantitative chemical analysis of fluorite-to-perovskite transformations in (PbLa)(ZrTi)O3 PLZT thin films.
Validation of the Dynamic Recrystallization (DRX) Mechanism for Whisker and Hillock Growth in Thin Films.
Conference
·
Tue Apr 01 00:00:00 EDT 2008
·
OSTI ID:1145669
Quantitative chemical analysis of fluorite-to-perovskite transformations in (PbLa)(ZrTi)O3 PLZT thin films.
Journal Article
·
Thu May 01 00:00:00 EDT 2008
· Journal of Materials Research
·
OSTI ID:1143394
Validation of the Dynamic Recrystallization (DRX) Mechanism for Whisker and Hillock Growth in Thin Films.
Conference
·
Sat Nov 01 00:00:00 EDT 2014
·
OSTI ID:1319745