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Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy.

Journal Article · Thu Jul 01 00:00:00 EDT 2010 · ACS Nano

OSTI ID:1123401

Shaner, Eric Arthur; gin, aaron; Talanov, Vladimir; Kalugin, Nikolai; Barga, Chris Del; Wickey, Lee; Kalichava, Irakli

Abstract not provided.

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1123401

Report Number(s):: SAND2010-4884J; 492188

Journal Information:: ACS Nano, Journal Name: ACS Nano

Country of Publication:: United States

Language:: English

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