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Title: Empirical Correlation for Minority Carrier Lifetime to Defect Density Profile in Germanium on Silicon Grown by Nanoscale Interfacial Engineering

Journal Article · · Journal of Vacuum Science and Technology B
DOI:https://doi.org/10.1116/1.4816488· OSTI ID:1113583

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
DOE Contract Number:
AC36-08GO28308
OSTI ID:
1113583
Journal Information:
Journal of Vacuum Science and Technology B, Vol. 31, Issue 5, September/October 2013; Related Information: Article No. 051201
Country of Publication:
United States
Language:
English