The Ultrathin Limit and Dead-layer Effects in Local Polarization Switching of BiFeO3
Journal Article
·
· Physical Review B
- ORNL
- University of Twente, Netherlands
- MESA+ University of Twente, Enschede, Netherlands
- University of California, Berkeley
Using piezoresponse force microscopy in ultra-high vacuum, polarization switching has been detected and quantified in epitaxial BiFeO3 films from 200 down to ~ 4 unit cells. Local remnant piezoresponse was used to infer the applied electric field inside the ferroelectric volume, and account for the elusive effect of dead-layers in ultrathin films. The dead-layer manifested itself in the slower than anticipated decrease of the switching bias with film thickness, yielding apparent Kay-Dunn scaling of the switching field, while the statistical analysis of hysteresis loops revealed lateral variation of the dead-layer with sub-10 nm resolution.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC05-00OR22725
- OSTI ID:
- 1113155
- Journal Information:
- Physical Review B, Vol. 85, Issue 1; ISSN 1098--0121
- Country of Publication:
- United States
- Language:
- English
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