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Radiation Effects in 3D Integrated SOI SRAM Circuits.

Journal Article · · IEEE Transactions on Nuclear Science, Dec. 2011
OSTI ID:1106916
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Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1106916
Report Number(s):
SAND2011-5770J; 464221
Journal Information:
IEEE Transactions on Nuclear Science, Dec. 2011, Journal Name: IEEE Transactions on Nuclear Science, Dec. 2011
Country of Publication:
United States
Language:
English

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