Rutherford Forward Scattering and Elastic Recoil Detection (RFSERD) as a Method for Characterizing Ultra-Thin Films.

Lohn, Andrew; Doyle, Barney Lee; Mickel, Patrick R.; Stevens, James E.; Marinella, Matthew

doi:10.1016/j.nimb.2014.02.038

Rutherford Forward Scattering and Elastic Recoil Detection (RFSERD) as a Method for Characterizing Ultra-Thin Films.

Conference · Sat Jun 01 00:00:00 EDT 2013

DOI:https://doi.org/10.1016/j.nimb.2014.02.038· OSTI ID:1106777

Lohn, Andrew; Doyle, Barney Lee; Mickel, Patrick R.; Stevens, James E.; Marinella, Matthew

Abstract not provided.

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1106777

Report Number(s):: SAND2013-5036C; 465284

Country of Publication:: United States

Language:: English

References (19)

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A physical model of switching dynamics in tantalum oxide memristive devices Mickel, Patrick R.; Lohn, Andrew J.; Joon Choi, Byung Applied Physics Letters, Vol. 102, Issue 22, Article No. 223502 https://doi.org/10.1063/1.4809530	journal	June 2013
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Characterization of thin films using heavy ion beams Timmers, H.; Elliman, R. G.; Ophel, T. R. Bulletin of Materials Science, Vol. 22, Issue 3 https://doi.org/10.1007/bf02749974	journal	May 1999
Metal–Oxide RRAM Wong, H.-S. Philip; Lee, Heng-Yuan; Yu, Shimeng Proceedings of the IEEE, Vol. 100, Issue 6, p. 1951-1970 https://doi.org/10.1109/JPROC.2012.2190369	journal	June 2012
Elastic scattering phenomenological analysis of the first resonant structure of theSi28+O16system Mermaz, M. C.; Chavez-Lomeli, E. R.; Barrette, J. Physical Review C, Vol. 29, Issue 1 https://doi.org/10.1103/physrevc.29.147	journal	January 1984
Measurement of the oxygen content in high-Tcsuperconductors: Enhanced resonant ion-scattering analysis Barbour, J. C.; Doyle, B. L.; Myers, S. M. Physical Review B, Vol. 38, Issue 10 https://doi.org/10.1103/physrevb.38.7005	journal	October 1988
A review of high energy backscattering spectrometry Tesmer, J. R.; Maggiore, C. J.; Nastasi, M. Materials Chemistry and Physics, Vol. 46, Issue 2-3 https://doi.org/10.1016/S0254-0584(97)80013-2	journal	November 1996
A review of high energy backscattering spectrometry Tesmer, J. R.; Maggiore, C. J.; Nastasi, M. Materials Chemistry and Physics, Vol. 46, Issue 2-3 https://doi.org/10.1016/s0254-0584(97)80013-2	journal	November 1996
Metal–Oxide RRAM Wong, H.-S. Philip; Lee, Heng-Yuan; Yu, Shimeng Proceedings of the IEEE, Vol. 100, Issue 6, p. 1951-1970 https://doi.org/10.1109/jproc.2012.2190369	journal	June 2012

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