Fast Ion Induced Shearing of 2D Alfvén Eigenmodes Measured by Electron Cyclotron Emission Imaging

Tobias, B. J.; Classen, I. G. J.; Domier, C. W.; Heidbrink, W. W.; Luhmann, N. C.; Nazikian, R.; Park, H. K.; Spong, D. A.; Van Zeeland, M. A.

doi:10.1103/PhysRevLett.106.075003

Title: Fast Ion Induced Shearing of 2D Alfvén Eigenmodes Measured by Electron Cyclotron Emission Imaging

Journal Article · Wed Feb 16 00:00:00 EST 2011 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.106.075003· OSTI ID:1099870

Tobias, B. J.; Classen, I. G. J.; Domier, C. W.; Heidbrink, W. W.; Luhmann, N. C.; Nazikian, R.; Park, H. K.; Spong, D. A.; Van Zeeland, M. A.

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Sponsoring Organization:: USDOE

OSTI ID:: 1099870

Journal Information:: Physical Review Letters, Journal Name: Physical Review Letters Vol. 106 Journal Issue: 7; ISSN 0031-9007

Publisher:: American Physical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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References (26)

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