Fast Ion Induced Shearing of 2D Alfven Eigenmodes Measured by Electron Cyclotron Emission Imaging

Journal Article · Sat Jan 01 04:00:00 EST 2011 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.106.075003· OSTI ID:1025864

Tobias, Ben ^[1]; Classen, I G.J. ^[2]; Domier, C W ^[1]; Heidbrink, W ^[3]; Luhmann, N C ^[1]; Nazikian, Raffi ^[4]; Park, H K ^[5]; Spong, Donald A ^[6]; Van Zeeland, Michael ^[7]

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1. University of California, Davis
2. FOM Institute for Plasma Physics Rijnhuizen, Nieuwegein, The Netherlands
3. University of California, Irvine
4. Princeton Plasma Physics Laboratory (PPPL)
5. Pohang University of Science and Technology (POSTECH), Pohang, Republic of Korea
6. ORNL
7. General Atomics

Two-dimensional images of electron temperature perturbations are obtained with electron cyclotron emission imaging (ECEI) on the DIII-D tokamak and compared to Alfven eigenmode structures obtained by numerical modeling using both ideal MHD and hybrid MHD-gyrofluid codes. While many features of the observations are found to be in excellent agreement with simulations using an ideal MHD code (NOVA), other characteristics distinctly reveal the influence of fast ions on the mode structures. These features are found to be well described by the nonperturbative hybrid MHD-gyrofluid model TAEFL.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1025864
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 7 Vol. 106; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
AXISYMMETRICAL TOROIDAL PLASMAS
CYCLOTRONS
DOUBLET-3 DEVICE
ELECTRON TEMPERATURE
ELECTRONS
GYROFLUID MODEL
PROFILE
SIMULATION
SPECTRUM