Space- and Time-Resolved Mapping of Ionic Dynamic and Electroresistive Phenomena in Lateral Devices

Journal Article · Tue Jan 01 00:00:00 EST 2013 · ACS Nano

DOI:https://doi.org/10.1021/nn4017873· OSTI ID:1090503

Strelcov, Evgheni ^[1]; Jesse, Stephen ^[1]; Yen-Lin, Huang ^[2]; Yung-Chun, Teng ^[2]; Kravchenko, Ivan I ^[1]; Ying-Hao, Chu ^[2]; Kalinin, Sergei V ^[1]

---

1. ORNL
2. National Chiao Tung University, Hsinchu, Taiwan

A novel scanning probe microscopy (SPM) based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms 10 s scale is presented. The time-resolved Kelvin Probe Force Microscopy (tr-KPFM) allows mapping surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in the Ca-substituted bismuth ferrite thin film.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1090503
• Journal Information: ACS Nano, Vol. 7, Issue 8; ISSN 1936--0851
• Country of Publication: United States
• Language: English

Related Subjects

KPFM
ionic dynamics
Ca-BFO
surface potential distribution
oxygen vacancy