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Title: Sample holder with optical features

Patent ·
OSTI ID:1088943

A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
ACO2-98CH10886
Assignee:
Brookhaven Science Associates, LLC (Upton, NY)
Patent Number(s):
8,497,487
Application Number:
13/398,623
OSTI ID:
1088943
Country of Publication:
United States
Language:
English

References (8)

TEM sample holder patent October 2006
Kit for preparing a tem sample holder patent October 2006
Method of preparing a sample for examination in a TEM patent January 2008
Sample holder, sample mount and sample mount jig for use in electron microscope patent June 2003
Method and apparatus for specimen fabrication patent September 2007
Method for preparing a sample for electron microscopic examinations, and sample supports and transport holders used therefor patent May 2008
Specimen tip and tip holder assembly patent-application February 2005
Transmission electron microscope sample holder with optical features patent March 2012