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Title: Transmission electron microscope sample holder with optical features

Abstract

A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

Inventors:
 [1];  [2];  [3]
  1. Port Jefferson, NY
  2. Stony Brook, NY
  3. Coram, NY
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1039198
Patent Number(s):
8,143,593
Application Number:
12/582,149
Assignee:
Brookhaven Science Associates, LLC (Upton, NY)
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Milas, Mirko, Zhu, Yimei, and Rameau, Jonathan David. Transmission electron microscope sample holder with optical features. United States: N. p., 2012. Web.
Milas, Mirko, Zhu, Yimei, & Rameau, Jonathan David. Transmission electron microscope sample holder with optical features. United States.
Milas, Mirko, Zhu, Yimei, and Rameau, Jonathan David. Tue . "Transmission electron microscope sample holder with optical features". United States. https://www.osti.gov/servlets/purl/1039198.
@article{osti_1039198,
title = {Transmission electron microscope sample holder with optical features},
author = {Milas, Mirko and Zhu, Yimei and Rameau, Jonathan David},
abstractNote = {A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {3}
}

Patent:

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Works referenced in this record:

Teflon feedthrough for coupling optical fibers into ultrahigh vacuum systems
journal, January 1998