Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry

Journal Article · Wed Dec 31 23:00:00 EST 2008 · Nanotechnology

DOI:https://doi.org/10.1088/0957-4484/20/25/255701· OSTI ID:1082025

Ovchinnikov, Oleg S. ^[1]; Jesse, Stephen ^[2]; Kalinin, Sergei V ^[2]

---

1. University of Tennessee, Knoxville (UTK)
2. ORNL

An adaptive scanning method in scanning probe microscopy (SPM) is developed for studies of surfaces with a highly-non-uniform information density such as nanowires or interfaces in disordered media. In path-engineered SPM, the surface is pre-scanned to locate features, and a secondary scan is acquired with the pixel density concentrated in the vicinity of the objects of interest. Here, we demonstrate this approach for piezoresponse force microscopy, and develop approaches for fractal and self-affine characterization of domain interfaces. The relationship between the variational roughness, structure factor, and correlation functions is established and resolution effects on these parameters are determined

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1082025
• Journal Information: Nanotechnology, Journal Name: Nanotechnology Journal Issue: 25 Vol. 20; ISSN 0957-4484
• Country of Publication: United States
• Language: English