Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy

Journal Article · Sat Dec 31 23:00:00 EST 2011 · Applied Physics Letters

OSTI ID:1081946

Kim, Yunseok ^[1]; Yang, J. -C. ^[2]; Chu, Ying Hao ^[3]; Yu, Pu ^[2]; Lu, X. ^[4]; Jesse, Stephen ^[1]; Kalinin, Sergei V ^[1]

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1. ORNL
2. University of California, Berkeley
3. National Chiao Tung University, Hsinchu, Taiwan
4. Xidian University, China

The dependence of on-field and off-field hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, Vac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with Vac is a necessary step to establish the veracity of PFM hysteresis measurements.

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1081946
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 19 Vol. 101
• Country of Publication: United States
• Language: English