Temperature dependance of polarization switching properties of ferroelectric Pb0.92La0.08Zr0.52Ti0.48O3 films grown on nickel foils
- Energy Systems
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- SC OFFICE OF BASIC ENERGY SCIENCES
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 1064608
- Report Number(s):
- ANL/ES/JA-75286
- Journal Information:
- Appl. Phys. Lett., Vol. 102, Issue 7 ; 2013
- Country of Publication:
- United States
- Language:
- ENGLISH
Similar Records
Effect of manganese oxide insertion layer on the dielectric and ferroelectric properties of Pb0.92La0.08Zr0.52Ti0.48O3 films grown by a sol–gel process
Fabrication and dielectric property of ferroelectric PLZT films grown on metal foils.
Ferroelectric thin films grown on base-metal foils for embedded passives.
Journal Article
·
Wed Jul 01 00:00:00 EDT 2015
· Materials Research Bulletin
·
OSTI ID:1064608
+2 more
Fabrication and dielectric property of ferroelectric PLZT films grown on metal foils.
Journal Article
·
Fri Jul 01 00:00:00 EDT 2011
· Mater. Res. Bull.
·
OSTI ID:1064608
+3 more
Ferroelectric thin films grown on base-metal foils for embedded passives.
Conference
·
Mon Jan 01 00:00:00 EST 2007
·
OSTI ID:1064608
+1 more