The LaueUtil toolkit for Laue photocrystallography. II. Spot finding and integration

Journal Article · Thu Oct 15 00:00:00 EDT 2015 · J. Synchrotron Rad.

DOI:https://doi.org/10.1107/S0909049512022637· OSTI ID:1044429

Kalinowski, Jaroslaw A.; Fournier, Bertrand; Makal, Anna; Coppens, Philip ^[1]

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1. LBNL

A spot-integration method is described which does not require prior indexing of the reflections. It is based on statistical analysis of the values from each of the pixels on successive frames, followed for each frame by morphological analysis to identify clusters of high value pixels which form an appropriate mask corresponding to a reflection peak. The method does not require prior assumptions such as fitting of a profile or definition of an integration box. The results are compared with those of the seed-skewness method which is based on minimizing the skewness of the intensity distribution within a peak's integration box. Applications in Laue photocrystallography are presented.

• Research Organization: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
• Sponsoring Organization: NSF
• OSTI ID: 1044429
• Journal Information: J. Synchrotron Rad., Journal Name: J. Synchrotron Rad. Journal Issue: (4) ; 07, 2012 Vol. 19; ISSN 0909-0495; ISSN JSYRES
• Country of Publication: United States
• Language: ENGLISH