The LaueUtil toolkit for Laue photocrystallography. I. Rapid orientation matrix determination for intermediate-size-unit-cell Laue data
- Buffalo
A new method for determination of the orientation matrix of Laue X-ray data is presented. The method is based on matching of the experimental patterns of central reciprocal lattice rows projected on a unit sphere centered on the origin of the reciprocal lattice with the corresponding pattern of a monochromatic data set on the same material. This technique is applied to the complete data set and thus eliminates problems often encountered when single frames with a limited number of peaks are to be used for orientation matrix determination. Application of the method to a series of Laue data sets on organometallic crystals is described. The corresponding program is available under a Mozilla Public License-like open-source license.
- Research Organization:
- Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
- Sponsoring Organization:
- NSF
- OSTI ID:
- 1033787
- Journal Information:
- J. Appl. Crystallogr., Journal Name: J. Appl. Crystallogr. Journal Issue: (6) ; 12, 2011 Vol. 44; ISSN JACGAR; ISSN 0021-8898
- Country of Publication:
- United States
- Language:
- ENGLISH
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