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Title: Three-Dimensional EBSD Analysis of YSZ, NiO-YSZ and Ni-Alloy

Conference ·
DOI:https://doi.org/10.1557/opl.2012.54· OSTI ID:1042545

In this report, a method is discussed to perform successive milling on yttria-stabilized zirconia (YSZ), NiO-YSZ and Ni-alloy at the intervals of 85 nm 50 nm and 100 nm, respectively using a focused ion beam (FIB) followed by electron backscatter diffraction (EBSD) analysis on each slice. The EBSD data is then reconstructed to generate 3D volume. The 3D-EBSD band quality data is superimposed on inverse pole figure (IPF) grain orientation analysis to get a correlation with quality of band indexing. For the NiO-YSZ case, grain orientations and band quality factors were matched for grains {approx}250 nm diameters producing a high resolution 3D-EBSD data. For this case, a pore space in 3D volume was visible due to nanocrystalline NiO-YSZ grain network. The advantages of 3D EBSD are discussed in the context of its applications to SOFC research community.

Research Organization:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
1042545
Report Number(s):
PNNL-SA-83896; KP1704020; TRN: US201212%%830
Resource Relation:
Conference: Materials Research Society Fall Meeting Proceedings: Symposium PP - Three-Dimensional Tomography of Materials, November 28 - December 2, 2011, Boston, Massachusetts, 1421
Country of Publication:
United States
Language:
English

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