Size-dependent Strain in Epitaxial (001)Gadolinium-doped Ceria Nanoislands

Journal Article · Sat Dec 31 00:00:00 EST 2011 · Applied Physics Letters

OSTI ID:1041787

Solovyov, V; Gibert, M; Puig, T; Obradors, X

We report size-dependent strain in epitaxial gadolinium doped ceria nanoislands, which was determined by synchrotron x-ray diffraction. Reciprocal space sections of symmetric, (004) and asymmetric, (224) reflections are approximated by a model assuming size-dependent strain of the islands using real-space size distribution obtained by atomic force microscopy. We show that the islands smaller than 40 nm are subjected to a high level of lateral tensile strain and normal compression. The lateral to normal strain ratio determined from the reciprocal map analysis suggests that lateral tension is the primary stress generator, possibly due to oxygen vacancy ordering on the island-substrate interface.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE SC OFFICE OF SCIENCE (SC)
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 1041787
• Report Number(s): BNL-97465-2012-JA; APPLAB; TRN: US201212%%199
• Journal Information: Applied Physics Letters, Vol. 97, Issue 23; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
CERIUM COMPOUNDS
COMPRESSION
DOPED MATERIALS
EPITAXY
DISTRIBUTION
GADOLINIUM
LAYERS
LEVELS
MAPS
OXYGEN
SIZE
SPACE
STRAINS
SYNCHROTRON RADIATION
SUBSTRATES
X-RAY DIFFRACTION