Material Quality Requirements for Efficient Epitaxial Film Silicon Solar Cells
The performance of 2-..mu..m-thick crystal silicon (c-Si) solar cells grown epitaxially on heavily doped wafer substrates is quantitatively linked to absorber dislocation density. We find that such thin devices have a high tolerance to bulk impurities compared to wafer-based cells. The minority carrier diffusion length is about half the dislocation spacing and must be roughly three times theabsorber thickness for efficient carrier extraction. Together, modeling and experimental results provide design guidelines for film c-Si photovoltaic cells.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Solar Energy Technologies Program
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1036360
- Report Number(s):
- NREL/JA-270-47595; MainId:49466; UUID:16b8e05f-e9d4-e411-b769-d89d67132a6d; MainAdminId:31558
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 7 Vol. 96; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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DESIGN
DIFFUSION LENGTH
DISLOCATIONS
IMPURITIES
MATERIALS SCIENCE
SOLAR ENERGY
PERFORMANCE
PHOTOVOLTAIC CELLS
RECOMMENDATIONS
SILICON
SILICON SOLAR CELLS
SIMULATION
SOLAR CELLS
SUBSTRATES
THICKNESS
TOLERANCE
carrier lifetime
elemental semiconductors
photovoltaic cells
semiconductor epitaxial layers
silicon
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DIFFUSION LENGTH
DISLOCATIONS
IMPURITIES
MATERIALS SCIENCE
SOLAR ENERGY
PERFORMANCE
PHOTOVOLTAIC CELLS
RECOMMENDATIONS
SILICON
SILICON SOLAR CELLS
SIMULATION
SOLAR CELLS
SUBSTRATES
THICKNESS
TOLERANCE
carrier lifetime
elemental semiconductors
photovoltaic cells
semiconductor epitaxial layers
silicon
solar cells