Finite-element analysis of the deformation of thin Mylar films due to measurement forces

Technical Report · Sat Dec 31 19:00:00 EST 2011

DOI:https://doi.org/10.2172/1034880· OSTI ID:1034880

Baker, Michael Sean ^[1]; Robinson, Alex Lockwood ^[1]; Tran, Hy D. ^[1]

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1. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Significant deformation of thin films occurs when measuring thickness by mechanical means. This source of measurement error can lead to underestimating film thickness if proper corrections are not made. Analytical solutions exist for Hertzian contact deformation, but these solutions assume relatively large geometries. If the film being measured is thin, the analytical Hertzian assumptions are not appropriate. ANSYS is used to model the contact deformation of a 48 gauge Mylar film under bearing load, supported by a stiffer material. Simulation results are presented and compared to other correction estimates. Ideal, semi-infinite, and constrained properties of the film and the measurement tools are considered.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1034880
• Report Number(s): SAND--2012-0186
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ACCURACY
ANALYTICAL SOLUTION
BEARINGS
DEFORMATION
MYLAR
POLYETHYLENES
POLYMERS
PROCESSING
PROCUREMENT
PRODUCTION
QUALITY CONTROL
REFRACTIVE INDEX
SHRINKAGE
SIMULATION
SOLVENTS
TESTING
THICKNESS
THIN FILMS