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Title: Laser desorption ionization and peptide sequencing on laser induced silicon microcolumn arrays

Patent ·
OSTI ID:1034108
 [1];  [2]
  1. Reston, VA
  2. San Diego, CA
+ Show Author Affiliations

The present invention provides a method of producing a laser-patterned silicon surface, especially silicon wafers for use in laser desorption ionization (LDI-MS) (including MALDI-MS and SELDI-MS), devices containing the same, and methods of testing samples employing the same. The surface is prepared by subjecting a silicon substrate to multiple laser shots from a high-power picosecond or femtosecond laser while in a processing environment, e.g., underwater, and generates a remarkable homogenous microcolumn array capable of providing an improved substrate for LDI-MS.

Research Organization:
George Washington Univ., Washington, DC (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-01ER15129
Assignee:
The George Washington University (Washington, DC)
Patent Number(s):
8,084,734
Application Number:
11/674,671
OSTI ID:
1034108
Country of Publication:
United States
Language:
English

References (8)

Nanoscale Atmospheric Pressure Laser Ablation-Mass Spectrometry journal April 2001
High Sensitivity and Analyte Capture with Desorption/Ionization Mass Spectrometry on Silylated Porous Silicon journal August 2004
Desorption−Ionization Mass Spectrometry Using Deposited Nanostructured Silicon Films journal March 2001
Mass Spectrometry Sampling Under Ambient Conditions with Desorption Electrospray Ionization journal October 2004
Laser Desorption-Atmospheric Pressure Chemical Ionization Mass Spectrometry for the Analysis of Peptides from Aqueous Solutions journal November 2002
Versatile New Ion Source for the Analysis of Materials in Open Air under Ambient Conditions journal April 2005
Direct Protein Detection from Biological Media through Electrospray-Assisted Laser Desorption Ionization/Mass Spectrometry journal May 2006
New dimension in nano-imaging: breaking through the diffraction limit with scanning near-field optical microscopy journal November 2004

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