Epitaxial Growth of Strontium Bismuth Tantalate/Niobate of Buffered Magnesium Oxide Substrates
Conference
·
OSTI ID:1033963
- ORNL
- University of Tennessee, Knoxville (UTK)
Epitaxial films of strontium bismuth tantalate (SrBi{sub 2}Ta{sub 2}O{sub 9}, SBT) and strontium bismuth niobate (SrBi{sub 2}Nb{sub 2}O{sub 9}, SBN) were grown using solution deposition techniques on magnesium oxide (MgO) substrates buffered with a 100 nm layer of lanthanum manganate (LaMnO{sub 3}, LMO). Film structure and texture analyses were carried out using x-ray diffraction. Theta-2theta diffraction patterns were consistent with a c-axis aligned structure for both the buffer layer and the solution deposited films. Theta-2 theta scans revealed (001){sub SBT, SBN}//(001) LMO epitaxial relationships between the solution deposited films and the buffer layer. A pole figure about the SBT, SBN (115) reflection indicated a single in-plane epitaxy. Film quality was assessed using {omega} and {phi} scans. Nuclear Magnetic Resonance ({sup 13}C) was used to characterized the methoxy-ethoxide solutions used for the deposition of the SBN and SBT films.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1033963
- Country of Publication:
- United States
- Language:
- English
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