Resolution theory and static- and frequency dependent cross-talk in piezoresponse force microscopy
- ORNL
- University College, Dublin
- Asylum Research, Santa Barbara, CA
Probing materials functionality locally by scanning probe microscopy requires reliable framework for identifying the target signal and separating it from the effects of surface morphology and instrument non-idealities, i.e. instrumental and topographical cross-talk. Here we develop the linear resolution theory framework to describe the cross-talk effects, and apply it for elucidation of frequency dependent cross-talk mechanisms in the Piezoresponse Force Microscopy. The use of band excitation method allows electromechanical/electrical and mechanical/topographic signals to be unambiguously separated. The applicability of functional fit approach and multivariate statistical analysis methods for data identification in band excitation SPM is explored.
- Research Organization:
- Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
- Sponsoring Organization:
- ORNL LDRD Seed-Money
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1030997
- Journal Information:
- Nanotechnology, Journal Name: Nanotechnology Journal Issue: 40 Vol. 21; ISSN 0957-4484
- Country of Publication:
- United States
- Language:
- English
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